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Ewald sphere correction for single-particle electron microscopy.
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Ewald sphere correction for single-particle electron microscopy.
Wolf M, DeRosier DJ, Grigorieff N. Ewald sphere correction for single-particle electron microscopy. Ultramicroscopy. 2006 Mar; 106(4-5):376-82.
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subject areas
Algorithms
Data Display
Fourier Analysis
Imaging, Three-Dimensional
Microscopy, Electron
Viruses
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Nikolaus Grigorieff PhD