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Connection

Johannes Elferich to Microscopy, Electron, Transmission

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This is a "connection" page, showing publications Johannes Elferich has written about Microscopy, Electron, Transmission.
Johannes Elferich
Connection Strength
0.885
Microscopy, Electron, Transmission
  1. Elferich J, Kong L, Zottig X, Grigorieff N. CTFFIND5 provides improved insight into quality, tilt, and thickness of TEM samples. Elife. 2024 Dec 20; 13.
    View in: PubMed
    Score: 0.885
Connection Strength

The connection strength for concepts is the sum of the scores for each matching publication.

Publication scores are based on many factors, including how long ago they were written and whether the person is a first or senior author.