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Spectrometry, Mass, Secondary Ion

"Spectrometry, Mass, Secondary Ion" is a descriptor in the National Library of Medicine's controlled vocabulary thesaurus, MeSH (Medical Subject Headings). Descriptors are arranged in a hierarchical structure, which enables searching at various levels of specificity.

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A mass-spectrometric technique that is used for microscopic chemical analysis. A beam of primary ions with an energy of 5-20 kiloelectronvolts (keV) bombards a small spot on the surface of the sample under ultra-high vacuum conditions. Positive and negative secondary ions sputtered from the surface are analyzed in a mass spectrometer in regards to their mass-to-charge ratio. Digital imaging can be generated from the secondary ion beams and their intensity can be measured. Ionic images can be correlated with images from light or other microscopy providing useful tools in the study of molecular and drug actions.


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This graph shows the total number of publications written about "Spectrometry, Mass, Secondary Ion" by people in this website by year, and whether "Spectrometry, Mass, Secondary Ion" was a major or minor topic of these publications.
Bar chart showing 15 publications over 8 distinct years, with a maximum of 4 publications in 1997
To see the data from this visualization as text, click here.