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Microscopy, Electron, Scanning

"Microscopy, Electron, Scanning" is a descriptor in the National Library of Medicine's controlled vocabulary thesaurus, MeSH (Medical Subject Headings). Descriptors are arranged in a hierarchical structure, which enables searching at various levels of specificity.

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Microscopy in which the object is examined directly by an electron beam scanning the specimen point-by-point. The image is constructed by detecting the products of specimen interactions that are projected above the plane of the sample, such as backscattered electrons. Although SCANNING TRANSMISSION ELECTRON MICROSCOPY also scans the specimen point by point with the electron beam, the image is constructed by detecting the electrons, or their interaction products that are transmitted through the sample plane, so that is a form of TRANSMISSION ELECTRON MICROSCOPY.


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This graph shows the total number of publications written about "Microscopy, Electron, Scanning" by people in this website by year, and whether "Microscopy, Electron, Scanning" was a major or minor topic of these publications.
Bar chart showing 68 publications over 24 distinct years, with a maximum of 6 publications in 2004 and 2008 and 2013
To see the data from this visualization as text, click here.